Sato, Y., & Kaufman, J. J. (2005). Value analysis tear-down: A new process for product development and innovation. Industrial Press : Society of Manufacturing Engineers.
Chicago Style (17th ed.) CitationSato, Yoshihiko, and J. Jerry Kaufman. Value Analysis Tear-down: A New Process for Product Development and Innovation. New York: Industrial Press : Society of Manufacturing Engineers, 2005.
MLA (9th ed.) CitationSato, Yoshihiko, and J. Jerry Kaufman. Value Analysis Tear-down: A New Process for Product Development and Innovation. Industrial Press : Society of Manufacturing Engineers, 2005.
Warning: These citations may not always be 100% accurate.