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Encyclopedia of materials characterization : surfaces, interfaces, thin films /

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Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials scie...

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Bibliographic Details
Corporate Author: Knovel (Firm)
Other Authors: Brundle, C. R., Evans, Charles A., Wilson, Shaun
Format: eBook
Language:English
Published: Boston : Greenwich, CT : Butterworth-Heinemann ; Manning, [1992]
Series:Materials characterization series.
Subjects:
Surfaces (Technology) > Testing.
Engenharia metalurgica e de materiais.
Surfaces (technologie)
Matériaux > Analyse.
Essais (technologie)
Messtechnik.
Dünne Schicht.
Stoffeigenschaft.
Oberflächeneigenschaft.
Grenzfläche.
Surfaces > Analysis
Electronic books.
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Introduction and summaries
  • Imaging techniques (Microscopy)
  • Electron beam instruments
  • Structure determination by diffraction and scattering
  • Electron emission spectroscopies
  • X-ray emission techniques
  • Visible/UV emission, reflection, and absorption
  • Vibrational spectroscopies and NMR
  • Ion scattering techniques
  • Mass and optical spectroscopies
  • Neutron and nuclear techniques
  • Physical and magnetic properties.