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Electronics reliability and measurement technology : nondestructive evaluation /

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This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

Bibliographic Details
Corporate Author: Knovel (Firm)
Other Authors: Heyman, Joseph S.
Format: eBook
Language:English
Published: Park Ridge, N.J., U.S.A. : Noyes Data Corp., [1988]
Subjects:
Integrated circuits > Reliability > Congresses.
Nondestructive testing > Congresses.
Integrated circuits > Testing > Congresses.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
Integrated circuits > Reliability.
Integrated circuits > Testing.
Nondestructive testing.
Electronic books.
Conference papers and proceedings.
Online Access:Connect to the full text of this electronic book
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Published 1988
Conference Proceeding Book
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