Cover Image

Electronics reliability and measurement technology : nondestructive evaluation /

Show other versions (2)

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

Bibliographic Details
Corporate Author: Knovel (Firm)
Other Authors: Heyman, Joseph S.
Format: eBook
Language:English
Published: Park Ridge, N.J., U.S.A. : Noyes Data Corp., [1988]
Subjects:
Integrated circuits > Reliability > Congresses.
Nondestructive testing > Congresses.
Integrated circuits > Testing > Congresses.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
Integrated circuits > Reliability.
Integrated circuits > Testing.
Nondestructive testing.
Electronic books.
Conference papers and proceedings.
Online Access:Connect to the full text of this electronic book
Description
Summary:This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
Item Description:"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Page vii.
Electronic resource.
Physical Description:1 online resource (xii, 128 pages) : illustrations
Format:Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Bibliography:Includes bibliographical references and index.
ISBN:1591240514
9781591240518
9780815511717
081551171X
9780815516996
0815516991
9780080944685
008094468X