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Analysis of sampled imaging systems /

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Advances in solid state detector arrays, flat panel displays, and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst--this tutorial...

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Bibliographic Details
Main Author: Vollmerhausen, Richard H.
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Driggers, Ronald G.
Format: eBook
Language:English
Published: Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) : SPIE, [2000]
Series:SPIE tutorial texts ; TT39.
Subjects:
Fourier analysis.
Image processing > Statistical methods.
Imaging systems > Image quality.
Sampling (Statistics)
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Summary:Advances in solid state detector arrays, flat panel displays, and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst--this tutorial's intended reader.
Item Description:"SPIE digital library."
Electronic resource.
Physical Description:1 online resource (xv, 176 pages) : illustrations.
Also available in print version.
Format:Mode of access: World Wide Web.
System requirements: Adobe Acrobat Reader.
Bibliography:Includes bibliographical references and index.
ISBN:9780819478580 (electronic)
DOI:10.1117/3.353257
Access:Restricted to subscribers or individual electronic text purchasers.