Variation-aware advanced CMOS devices and SRAM /

Bibliographic Details

Main Author:	Shin, Changhwan (Author)
Corporate Author:	ebrary, Inc
Format:	eBook
Language:	English
Published:	Dordrecht : Springer, [2016]
Series:	Springer series in advanced microelectronics ; 56.
Subjects:	Metal oxide semiconductors, Complementary. Random access memory. Electronic books.
Online Access:	Connect to the full text of this electronic book