Table of Contents:
  • 6. Electron diffraction II
  • 6.1 Kikuchi diffraction
  • 6.1.1 Formation of Kikuchi lines
  • 6.1.2 Kikuchi diffraction and crystal tilt
  • 6.2 Convergent-beam electron diffraction
  • 6.2.1 Formation of convergent-beam diffraction
  • 6.2.2 High-order Laue zone
  • 6.2.3 Experimental procedures
  • 6.3 Nano-beam electron diffraction
  • 6.3.1 Formation of nano-beam electron diffraction
  • 6.3.2 Experimental procedures
  • References
  • 7. Imaging II
  • 7.1 STEM imaging
  • 7.1.1 Formation of STEM images and optics
  • 7.1.2 STEM experimental procedures
  • 7.1.3 STEM applications
  • 7.2 High-resolution transmission electron microscopy
  • 7.2.1 Principles of HRTEM
  • 7.2.2 Experimental operations
  • 7.2.3 Image interpretation and simulation
  • 7.2.4 Image processing
  • References
  • 8. Elemental analyses
  • 8.1 X-ray energy-dispersive spectroscopy
  • 8.1.1 Formation of characteristic x-rays
  • 8.1.2 EDS detector
  • 8.1.3 EDS artifacts
  • 8.1.4 Effects of specimen thickness, tilt, and space location
  • 8.1.5 Experimental procedures
  • 8.1.6 EDS applications
  • 8.2 Electron energy-loss spectroscopy
  • 8.2.1 Formation of EELS
  • 8.2.2 EELS qualitative and quantitative analyses
  • 8.2.3 Energy-filtered TEM
  • 8.2.4 EFTEM experimentation and applications
  • References
  • 9. Specific applications
  • 9.1 Quantitative microscopy
  • 9.1.1 Quantification of size homogeneity
  • 9.1.2 Quantification of directional homogeneity
  • 9.1.3 Dispersion quantification
  • 9.1.4 Electron diffraction pattern processing and refinement
  • 9.2 In situ microscopy
  • 9.2.1 In situ heating
  • 9.2.2 In situ cooling
  • 9.2.3 In situ irradiation
  • 9.3 Cryo-EM
  • 9.4 Low-dose imaging
  • 9.5 Electron tomography
  • 9.5.1 Experimental procedures
  • 9.5.2 Object shapes
  • 9.5.3 Nanoparticle assemblies
  • 9.5.4 Nanoparticle superlattices
  • References
  • Illustration credits
  • Index.