rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: High-Resolution X-Ray Scattering
    sub title: From Thin Films to Lateral Nanostructures
  name:
    name part: Pietsch, Ulrich.
    role:
      role term: creator
  name:
    name part: Holý, Václav.
  name:
    name part: Baumbach, Tilo.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  genre: Electronic books.
  origin info:
    place:
      place term: nyu
    date issued: 2004
    edition: Second edition.
    issuance: monographic
  language:
    language term: eng
  physical description:
    reformatting quality: access
    form: remote
    extent: 1 online resource (xvi, 408 pages)
  abstract: The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots. Both the theoretical background and the application of the methods are discussed. The second edition is extended to deal with lateral surface nanostructures such as gratings and dots, new examples for measuring layer thickness, lattice mismatch, and surface/interface roughness. The book will be an invaluable source for graduates and scientists.
  table of contents: Part I. Experimental Realization: Elements for Designing an X-Ray Diffraction Experiment; Diffractometers and Reflectometers; Scans and Resolution in Angular and Reciprocal Space -- Part II. Basic Principles: Basic Principles; Kinematic Theory; Dynamical Theory; Semikinematic Theory -- Part III. Determination of Layer Thicknesses of Single Layers and Multilayers: Lattice Parameters and Lattice Strains in Single Epitaxial Layers and Multilayers; Diffuse Scattering from Volume Defects in Thin Layers; X-Ray Scattering by Rough Multilayers -- Part IV. X-Ray Scattering by Laterally Constructed Semiconductor Nanostructures: X-Ray Scattering by Artificially Lateral Semiconductor Nanostructures; Strain Analysis in Periodic Nanostructures; X-Ray Scattering from Self-Organized Structures -- References -- Index.
  note: by Ullrich Pietsch, Václav Holý, Tilo Baumbach.
  note: Electronic resource.
  subject:
    topic: Optical materials
  subject:
    topic: Nanotechnology
  subject:
    topic: Surfaces (Physics)
  subject:
    topic: Nanotechnology
  subject:
    topic: Optical materials
  subject:
    topic: Surfaces (Physics)
  classification: TA418.7-418.76
  classification: TA418.9.T45
  classification: 620.44
  related item:
    title info:
      title: Advanced texts in physics
  identifier: 9781475740509 (electronic bk.)
  identifier: 1475740506 (electronic bk.)
  identifier: 9781441923073
  identifier: 1441923071
  identifier: 1475740506
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: AU@
    record creation date: 130107
    record change date: 20260420211911.6
    record identifier: in00003581426
    language of cataloging:
      language term: eng