APA (7th ed.) Citation

Leblebici, Y., & Kang, S. (1993). Hot-Carrier Reliability of MOS VLSI Circuits. Springer US.

Chicago Style (17th ed.) Citation

Leblebici, Yusuf, and Sung-Mo Kang. Hot-Carrier Reliability of MOS VLSI Circuits. Boston, MA: Springer US, 1993.

MLA (9th ed.) Citation

Leblebici, Yusuf, and Sung-Mo Kang. Hot-Carrier Reliability of MOS VLSI Circuits. Springer US, 1993.