rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Atomic Physics with Heavy Ions
  name:
    name part: Beyer, Heinrich F.
    role:
      role term: creator
  name:
    name part: Shevelko, Viatcheslav P.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  genre: Electronic books.
  origin info:
    place:
      place term: gw
    date issued: 1999
    issuance: monographic
  language:
    language term: eng
  physical description:
    reformatting quality: access
    form: remote
    extent: 1 online resource (xi, 396 pages)
  abstract: The book guides the reader to the research frontiers in atomic physics with heavy ions, giving a concise image of the advanced experimental and theoretical methods exemplified by the most recent results. It ranges from accelerator and ion trap technology, over the important and fundamental details in the understanding of strongly bound far-electron systems, to radiative and collisional phenomena of these objects. The subfields have been carefully selected; each is covered by leading experts who draw a lively picture of their research.
  table of contents: Experimental Methods -- Fundamental Properties -- Collisional and Radiative Processes.
  note: edited by Heinrich F. Beyer, Viatcheslav P. Shevelko.
  note: Electronic resource.
  subject:
    topic: Physics
  subject:
    topic: Physics
  classification: QC170-197
  classification: QC717.6-718.8
  classification: 539
  related item:
    title info:
      title: Springer series on atoms + plasmas ; 26
  identifier: 9783642585807 (electronic bk.)
  identifier: 3642585809 (electronic bk.)
  identifier: 9783642636561
  identifier: 364263656X
  identifier: 3642585809
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: AU@
    record creation date: 121227
    record change date: 20260422203953.8
    record identifier: in00003577021
    language of cataloging:
      language term: eng