Picosecond Electronics and Optoelectronics : Proceedings of the Topical Meeting Lake Tahoe, Nevada, March 13-15, 1985 /

VLSI Systems and Computations /
by: Kung, H. T.
Published: (1981)

Third Caltech Conference on Very Large Scale Integration /
by: Bryant, Randal E.
Published: (1983)

Electromagnetic Devices for Motion Control and Signal Processing /
by: Pulyer, Yuly M.
Published: (1992)

Optical Resonators : Fundamentals, Advanced Concepts and Applications /
by: Hodgson, Norman
Published: (1997)

Silicon Microchannel Heat Sinks : Theories and Phenomena /
by: Zhang, Lian
Published: (2004)

Very Large Scale Integration (VLSI) : Fundamentals and Applications /
by: Barbe, David F.
Published: (1980)

Magnetic Bubble Technology /
by: Eschenfelder, Andrew H.
Published: (1980)

Aerospace Sensor Systems and Applications /
by: Merhav, Shmuel
Published: (1996)

Current Trends in Hardware Verification and Automated Theorem Proving /
by: Birtwistle, G. M. (Graham M.)
Published: (1989)

Environmental and Space Electromagnetics /
by: Kikuchi, Hiroshi
Published: (1991)

Very Large Scale Integration (VLSI) : Fundamentals and Applications /
by: Barbe, David F.
Published: (1982)

Superconducting Quantum Electronics /
by: Kose, Volkmar
Published: (1989)

Reliability of Electronic Components : a Practical Guide to Electronic Systems Manufacturing /
by: Băjenescu, Titu I., 1938-
Published: (1999)

ESD - The Scourge of Electronics /
by: Hellström, S. (Sten)
Published: (1998)

Soft computing in industrial electronics /
by: Ovaska, Seppo J., et al.
Published: (2002)

VLSI Technology : Fundamentals and Applications /
by: Tarui, Yasuo
Published: (1986)

POF - Polymer Optical Fibers for Data Communication /
by: Daum, Werner
Published: (2002)

Scanning Microscopy : Symposium Proceedings /
by: Kassing, R. (Rainer)
Published: (1992)

High-Frequency Bipolar Transistors : Physics, Modeling, Applications /
by: Reisch, M. (Michael)
Published: (2003)

Reliability of Optical Fibres and Components : Final Report of COST 246 /
by: Gadonna, Michel
Published: (1999)

Compound Semiconductor Device Modelling /
by: Snowden, Christopher M.
Published: (1993)

Electronic Properties of Materials /
by: Hummel, Rolf E.
Published: (2001)

Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon /
by: Pichler, P. (Peter)
Published: (2004)

Physics for Computer Science Students : With Emphasis on Atomic and Semiconductor Physics /
by: García, Narciso, 1954-
Published: (1991)

Nondestructive Evaluation of Materials by Infrared Thermography /
by: Maldague, Xavier P. V.
Published: (1993)

The Monte Carlo Method for Semiconductor Device Simulation /
by: Jacoboni, Carlo
Published: (1989)

Microwave Materials /
by: Murthy, V. R. K.
Published: (1994)

Hierarchical Device Simulation : the Monte-Carlo Perspective /
by: Jungemann, Christoph
Published: (2003)

Product Integrity and Reliability in Design /
by: Evans, John W.
Published: (2001)

Lock-in Thermography : Basics and Use for Functional Diagnostics of Electronic Components /
by: Breitenstein, O. (Otwin)
Published: (2003)

Picosecond Electronics and Optoelectronics II : Proceedings of the Second OSA-IEEE (LEOS) Incline Village, Nevada, January 14-16, 1987 /
by: Leonberger, Frederick John
Published: (1987)

Technology of Integrated Circuits /
by: Widmann, D. (Dietrich)
Published: (2000)

Fundamentals of Electronic Imaging Systems : Some Aspects of Image Processing /
by: Schreiber, William F.
Published: (1986)

Simulation of Semiconductor Processes and Devices 2001 : SISPAD 01 /
by: Tsoukalas, Dimitris
Published: (2001)

Modelling of Microfabrication Systems /
by: Nassar, Raja
Published: (2003)

Quality and Reliability of Technical Systems : Theory - Practice - Management /
by: Birolini, Alessandro
Published: (1994)