rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: High-Resolution Electron Microscopy for Materials Science
  name:
    name part: Shindo, Daisuke.
    role:
      role term: creator
  name:
    name part: Hiraga, Kenji.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  genre: Electronic books.
  origin info:
    place:
      place term: ja
    date issued: 1998
    issuance: monographic
  language:
    language term: eng
  physical description:
    reformatting quality: access
    form: remote
    extent: 1 online resource (ix, 190 pages 203 illustrations)
  abstract: High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.
  table of contents: Basis of Transmission Electron Microscopy: Principles of Transmission Electron Microscopy. Electron Scattering and Fourier Transformation. Formation of High-Resolution Electron Microscopy. Computer Simulation of High-Resolution Electron Microscopy -- Practice of High-Resolution Electron Microscopy: Classifications of High-Resolution Electron Microscope Images. Practice of High-Resolution Electron Microscope Observation -- Application of High-Resolution Electron Microscopy: High-Resolution Electron Microscope Images of Lattice Defects, Surface and Interface. High-Resolution Electron Microscope Images of Various Materials. Peripheral Instruments and Techniques for High-Resolution Electron Microscopy: Image Processing. Quantitative Analysis. Electron Diffraction. Weak Beam Technique. Evaluation of Characteristic Parameters of Electron Microscopes. Specimen Preparation Techniques -- Appendix.
  note: by Daisuke Shindo, Kenji Hiraga.
  note: Electronic resource.
  subject:
    topic: Surfaces (Physics)
  subject:
    topic: Surfaces (Physics)
  classification: TA404.6
  classification: 620.11
  identifier: 9784431684220 (electronic bk.)
  identifier: 4431684220 (electronic bk.)
  identifier: 9784431702344
  identifier: 4431702342
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: AU@
    record creation date: 121227
    record change date: 20260422154505.7
    record identifier: in00003574638
    language of cataloging:
      language term: eng