Nicolaidis, M., Zorian, Y., & Pradhan, D. K. (1998). On-Line Testing for VLSI. Springer US.
Chicago Style (17th ed.) CitationNicolaidis, Michael, Yervan Zorian, and Dhiraj K. Pradhan. On-Line Testing for VLSI. Boston, MA: Springer US, 1998.
MLA (9th ed.) CitationNicolaidis, Michael, et al. On-Line Testing for VLSI. Springer US, 1998.
Warning: These citations may not always be 100% accurate.