Jha, N. K., & Kundu, S. (1990). Testing and Reliable Design of CMOS Circuits. Springer US.
Chicago Style (17th ed.) CitationJha, Niraj K., and Sandip Kundu. Testing and Reliable Design of CMOS Circuits. Boston, MA: Springer US, 1990.
MLA (9th ed.) CitationJha, Niraj K., and Sandip Kundu. Testing and Reliable Design of CMOS Circuits. Springer US, 1990.
Warning: These citations may not always be 100% accurate.