Nanoscale Characterisation of Ferroelectric Materials : Scanning Probe Microscopy Approach /
This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferr...
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| Format: | eBook |
| Language: | English |
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Berlin, Heidelberg :
Springer Berlin Heidelberg,
2004.
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| Series: | Nanoscience and technology.
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| Online Access: | Connect to the full text of this electronic book |
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