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Nanoscale Characterisation of Ferroelectric Materials : Scanning Probe Microscopy Approach /

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This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferr...

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Bibliographic Details
Main Author: Alexe, M. (Marin)
Corporate Author: SpringerLink (Online service)
Other Authors: Gruverman, A. (Alexei)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2004.
Series:Nanoscience and technology.
Subjects:
Physics.
Magnetism.
Engineering.
Nanotechnology.
Materials.
Electronic books.
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces
  • Challenges in the Analysis of the Local Piezoelectric Response
  • Electrical Characterization of Nanoscale Ferroelectric Structures
  • Nanoscale Optical Probes of Ferroelectric Materials
  • Scanning Probe Dielectric Microscopy for Investigation of Ferroelectric Polarization
  • Nanoscale Piezoelectric Phenomena in Epitaxial PZT Thin Films
  • Scanning Probe Microscopy of Ferroelectric Domains near Phase Transitions
  • Nanodomain Engineering in Ferroelectric Crystals Using High Voltage Atomic Force Microscopy
  • Nanoinspection of Dielectric and Polarization at Inner and Outer Interfaces in PZT Thin Films.