Alexe, M., & Gruverman, A. (2004). Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach. Springer Berlin Heidelberg.
Chicago Style (17th ed.) CitationAlexe, M., and A. Gruverman. Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004.
MLA (9th ed.) CitationAlexe, M., and A. Gruverman. Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach. Springer Berlin Heidelberg, 2004.
Warning: These citations may not always be 100% accurate.