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High-Resolution Imaging and Spectrometry of Materials /

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This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from rese...

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Bibliographic Details
Main Author: Ernst, Frank
Corporate Author: SpringerLink (Online service)
Other Authors: Rühle, Manfred
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2003.
Series:Springer series in materials science ; 50.
Subjects:
Physical organic chemistry.
Surfaces (Physics)
Electronic books.
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Microcharacterisation of Materials
  • Electron Scattering
  • Structure Determination by Quantitative High-Resolution Electron Microscopy
  • Quantitative Analytical Transmission Electron Microscopy
  • Advances in Electron Optics
  • Tomography by Atom Probe Field Ion Microscopy
  • Scanning Tunnelling Microscopy and Spectroscopy, Atomic Force Microscopy
  • Multi-Method High-Resolution Surface Analysis with Slow Electrons
  • From Microcharacterization to Macroscopic Property: A Pathway Discussed on Metal/Ceramic Composites
  • Microstructural Characterization of Materials: An Assessment.