Test and Design-for-Testability in Mixed-Signal Integrated Circuits /
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck...
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| Format: | eBook |
| Language: | English |
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Boston, MA :
Springer US,
2004.
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| Online Access: | Connect to the full text of this electronic book |
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