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Test and Design-for-Testability in Mixed-Signal Integrated Circuits /

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Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck...

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Bibliographic Details
Main Author: Huertas, José L.
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Boston, MA : Springer US, 2004.
Subjects:
Engineering.
Computer engineering.
Systems engineering.
Electronic books.
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Foreword
  • Contributors
  • Introduction
  • 1. Mixed-Signal Test
  • 2. Analog and Mixed Signal Test Bus
  • 3. Test of A/D Converters
  • 4. Phased Locked Loop Test Methodologies
  • 5. Behavioral Testing of Mixed-Signal Circuits
  • 6. Behavioral Modeling of Multistage ADCs and its Use for Design, Calibration and Test
  • 7. DFT and BIST Techniques for Embedded Analog Integrated Filters
  • 8. Oscillation-based Test Strategies.