Scanning Tunneling Microscopy and Related Methods /

Bibliographic Details
Main Author: Behm, R. J.
Corporate Author: SpringerLink (Online service)
Other Authors: García, N., Rohrer, H.
Format: eBook
Language:English
Published: Dordrecht : Springer Netherlands, 1990.
Series:NATO ASI series. Applied sciences ; 184.
Subjects:
Online Access:Connect to the full text of this electronic book

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