Ferroelectric memories /

Ferroelectric memories have changed in 10 short years from academic curiosities of the university research labs to commercial devices in large-scale production. This is the first text on ferroelectric memories that is not just an edited collection of papers by different authors. Intended for applied...

Full description

Bibliographic Details
Main Author: Scott, J. F. (James Floyd), 1942-
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin ; New York : Springer, 2000.
Series:Springer series in advanced microelectronics ; 3.
Subjects:
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • 1. Introduction
  • 2. Basic Properties of RAMs (Random Access Memories)
  • 3. Electrical Breakdown (DRAMs and NV-RAMs)
  • 4. Leakage Currents
  • 5. Capacitance
  • Voltage Data: C(V)
  • 6. Switching Kinetics
  • 7. Charge Injection and Fatigue
  • 8. Frequency Dependence
  • 9. Phase Sequences in Processing
  • 10. SBT-Family Aurivillius-Phase Layer Structures
  • 11. Deposition and Processing
  • 12. Nondestructive Read-Out Devices
  • 13. Ferroelectrics-on-Superconductor Devices: Phased-Array Radar and 10-100 GHz Devices
  • 14. Wafer Bonding
  • 15. Electron-Emission and Flat-Panel Displays
  • 16. Optical Devices
  • 17. Nanophase Devices
  • 18. Drawbacks and Disadvantages.