Characterization of Crystal Growth Defects by X-Ray Methods /

Bibliographic Details

Main Author:	Tanner, Brian K.
Corporate Author:	SpringerLink (Online service)
Other Authors:	Bowen, D. Keith
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 1980.
Series:	NATO advanced study institutes series. Physics ; 63.
Subjects:	Physics. Electronic books.
Online Access:	Connect to the full text of this electronic book