APA (7th ed.) Citation

Tanner, B. K., & Bowen, D. K. (1980). Characterization of Crystal Growth Defects by X-Ray Methods. Springer US.

Chicago Style (17th ed.) Citation

Tanner, Brian K., and D. Keith Bowen. Characterization of Crystal Growth Defects by X-Ray Methods. Boston, MA: Springer US, 1980.

MLA (9th ed.) Citation

Tanner, Brian K., and D. Keith Bowen. Characterization of Crystal Growth Defects by X-Ray Methods. Springer US, 1980.