http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Defect oriented testing for CMOS analog and digital circuits
1 online resource (xiv, 308 pages) : illustrations.
Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives.
Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subjects. It is essential reading for all design and test professionals as well as researchers and students working in the field.
Ch. 1. Introduction -- Ch. 2. Digital CMOS Fault Modeling and Inductive Fault Analysis -- Ch. 3. Defects in Logic Circuits and Their Test Implications -- Ch. 4. Testing Defects in Sequential Circuits -- Ch. 5. Defect Oriented RAM Testing and Current Testable RAMs -- Ch. 6. Testing Defects in Programmable Logic Circuits -- Ch. 7. Defect Oriented Analog Testing -- Ch. 8. Conclusion.
Includes bibliographical references and index.
Metal oxide semiconductors, Complementary