rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Defect oriented testing for CMOS analog and digital circuits
  name:
    name part: Sachdev, Manoj.
    role:
      role term: creator
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: mau
    date issued: 1998
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xiv, 308 pages) : illustrations.
  abstract: Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives.
  abstract: Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subjects. It is essential reading for all design and test professionals as well as researchers and students working in the field.
  table of contents: Ch. 1. Introduction -- Ch. 2. Digital CMOS Fault Modeling and Inductive Fault Analysis -- Ch. 3. Defects in Logic Circuits and Their Test Implications -- Ch. 4. Testing Defects in Sequential Circuits -- Ch. 5. Defect Oriented RAM Testing and Current Testable RAMs -- Ch. 6. Testing Defects in Programmable Logic Circuits -- Ch. 7. Defect Oriented Analog Testing -- Ch. 8. Conclusion.
  note: by Manoj Sachdev.
  note: Includes bibliographical references and index.
  subject:
    topic: Metal oxide semiconductors, Complementary
    topic: Testing
  subject:
    topic: Metal oxide semiconductors, Complementary
    topic: Defects
  subject:
    topic: Linear integrated circuits
    topic: Testing
  subject:
    topic: Digital integrated circuits
    topic: Testing
  subject:
    topic: CMOS-Schaltung
  subject:
    topic: Testen
  subject:
    topic: Digital integrated circuits
    topic: Testing
  subject:
    topic: Linear integrated circuits
    topic: Testing
  subject:
    topic: Metal oxide semiconductors, Complementary
    topic: Defects
  subject:
    topic: Metal oxide semiconductors, Complementary
    topic: Testing
  classification: TK7871.99.M44 S23 1998eb
  classification: 621.3815
  related item:
    title info:
      title: Defect oriented testing for CMOS analog and digital circuits
    name:
      name part: Sachdev, Manoj.
    identifier: (DLC) 97039048
    identifier: (OCoLC)37862692
  related item:
    title info:
      title: Frontiers in electronic testing
  identifier: 9781475749267 (electronic bk.)
  identifier: 1475749260 (electronic bk.)
  identifier: 0792380835
  identifier: 9780792380832
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: GW5XE
    record creation date: 131029
    record change date: 20260422204359.3
    record identifier: in00003562169
    language of cataloging:
      language term: eng