APA (7th ed.) Citation

Beenker, F. P. M., Bennetts, R. G., & Thijssen, A. P. (1995). Testability Concepts for Digital ICs: The Macro Test Approach. Springer US.

Chicago Style (17th ed.) Citation

Beenker, F. P. M., R. G. Bennetts, and A. P. Thijssen. Testability Concepts for Digital ICs: The Macro Test Approach. Boston, MA: Springer US, 1995.

MLA (9th ed.) Citation

Beenker, F. P. M., et al. Testability Concepts for Digital ICs: The Macro Test Approach. Springer US, 1995.