Software Defect and Operational Profile Modeling /

Also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1.

Bibliographic Details
Main Author: Cai, Kai-Yuan
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Boston, MA : Springer US, 1998.
Series:Kluwer international series in software engineering ; 4.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:Also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1.
Item Description:Electronic resource.
Physical Description:1 online resource (xix, 268 pages)
ISBN:9781461555933 (electronic bk.)
1461555930 (electronic bk.)
ISSN:1384-6469 ;