Point Defects in Semiconductors II : Experimental Aspects /

Bibliographic Details
Main Author: Bourgoin, Jacques
Corporate Author: SpringerLink (Online service)
Other Authors: Lannoo, Michel
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 1983.
Series:Springer series in solid-state sciences ; 35.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:1 online resource (xvi, 295 pages 116 illustrations)
ISBN:9783642818325 (electronic bk.)
3642818323 (electronic bk.)
ISSN:0171-1873 ;