APA (7th ed.) Citation

Bourgoin, J., & Lannoo, M. (1983). Point Defects in Semiconductors II: Experimental Aspects. Springer Berlin Heidelberg.

Chicago Style (17th ed.) Citation

Bourgoin, Jacques, and Michel Lannoo. Point Defects in Semiconductors II: Experimental Aspects. Berlin, Heidelberg: Springer Berlin Heidelberg, 1983.

MLA (9th ed.) Citation

Bourgoin, Jacques, and Michel Lannoo. Point Defects in Semiconductors II: Experimental Aspects. Springer Berlin Heidelberg, 1983.