Semiconductor Interfaces : Formation and Properties /
The trend towards miniaturization of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role upon semiconductor interfaces. Great advances have recently been made in the production of new thin-film materials and in the characterization...
| Main Author: | |
|---|---|
| Corporate Author: | |
| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
Berlin, Heidelberg :
Springer Berlin Heidelberg,
1987.
|
| Series: | Springer proceedings in physics ;
22. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Summary: | The trend towards miniaturization of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role upon semiconductor interfaces. Great advances have recently been made in the production of new thin-film materials and in the characterization of their interfacial properties down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures given by specialists at the International Winter School on "Semiconductor Interfaces: Formation and Properties", which was held at the Centre de Physique des Houches from 24 February to 6 March, 1987. The following topics are particularly emphasised: - Interface formation, including molecular beam epitaxy, the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. - Characterization down to the atomic scale using techniques such as STM, HRTEM, SEXAFS and SEELFS. - Specific physical properties of the interfaces and their prospective device applications. |
|---|---|
| Item Description: | Electronic resource. |
| Physical Description: | 1 online resource (xi, 389 pages 243 illustrations) |
| ISBN: | 9783642729676 (electronic bk.) 3642729673 (electronic bk.) |
| ISSN: | 0930-8989 ; |