Neutron-transmutation-doped silicon /

Neutron transmutation doping in semiconductors : [proceedings of the Second International Conference on Neutron Transmutation Doping Semiconductors, held at the University of Missouri, Columbia, Missouri, April 23-26, 1978] /
Published: (1979)

An investigation of magnesium production in silicon by neutron transmutation /
by: Davis, Freddie Joe, 1962-
Published: (1986)

Residual lattice disorder in Gallium Arsenide due to neutron transmutation doping /
by: Seager, Kevin Douglas, 1962-
Published: (1990)

Acceptor and donor production in Hg b1 s[subscript -x]Cd[subscript x]Te by neutron transmutation doping /
by: Seager, Kevin Douglas, 1962-
Published: (1985)

Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A. /
Published: (1997)

Si front-end processing : physics and technology of dopant-defect interactions II : symposium held April 24-27, 2000, San Francisco, California, USA /
Published: (2001)

Si front-end processing : physics and technology of dopant-defect interactions III : symposium held April 17-19, 2001, San Francisco, California, USA /
Published: (2001)

Si front-end processing : physics and technology of dopant-defect interactions : symposium held April 6-9, 1999, San Francisco, California, U.S.A. /
Published: (1999)

Metal impurities in silicon-device fabrication /
by: Graff, Klaus, 1931-
Published: (2000)

Neutron Transmutation Doping of Gallium Arsenide.
by: Juneau, Jon
Published: (1978)

Semiconductor technology : processing and novel fabrication techniques /
Published: (1997)

Silicon front-end technology--materials processing and modelling : symposium held April 13-15, 1998 in San Francisco, California, U.S.A. /
Published: (1998)

Defects in silicon : proceedings of symposium b on science and technology of defects in silicon of the 1989 E-MRS conference, Strasbourg, France, 30 May-2 June 1989 /
Published: (1989)

Impurity diffusion and gettering in silicon : symposium held November 27-30, 1984, Boston, Massachusetts, U.S.A. /
Published: (1985)

Silicon carbide 2004--materials, processing and devices : symposium held April 14-15, 2004, San Francisco, California, U.S.A. /
Published: (2004)

Design of shallow p-type dopants in ZnO : preprint /
by: Wei, Su-Huai
Published: (2008)

Design of Shallow p-type Dopants in ZnO (Presentation) /
by: Wei, Su-Huai
Published: (2008)

Imperfections and impurities in semiconductor silicon /
by: Ravi, K. V., 1940-
Published: (1981)

Intrinsic point defects, impurities, and their diffusion in silicon /
by: Pichler, P. (Peter)
Published: (2004)

Impurity doping processes in silicon /
Published: (1981)

Impurity doping processes in silicon /
Published: (1981)

Early stages of oxygen precipitation in silicon /
Published: (1996)

C, H, N and O in Si and Characterization and Simulation of Materials and Processes : Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 /
Published: (1996)

Glow-discharge hydrogenated amorphous silicon /
Published: (1989)

Crystalline oxide-silicon heterostructures and oxide optoelectronics : symposium held December 2-4, 2002, Boston, Massachusetts, U.S.A. /
Published: (2003)

Semiconductor silicon crystal technology /
by: Shimura, Fumio
Published: (1989)

Handbook of semiconductor silicon technology /
Published: (1990)

Epitaxial silicon technology /
Published: (1986)

Hydrogenated amorphous silicon /
Published: (1984)

Selected Topics in Group IV and II-VI Semiconductors : Proceedings of Symposium L and Symposium D of the 1995 E-Mrs Spring Conference, Strasbourg, France, 22-26 May 1995 /
Published: (1996)

Modeling metallic precipitate dissolution in silicon under point defect injection : final subcontract report, 20 January 2004-19 January 2005 /
by: Tan, T. Y.
Published: (2005)

Silicon /
Published: (1981)

Properties of doped semiconducting materials /
Published: (1993)

Scanning laser photoluminescence imaging system for nondestructive evaluation of direct bandgap materials /
by: Moon, Inchul, 1958-
Published: (1986)

Epitaxial Layer Manufacturing Special topic volume with invited peer-reviewed papers only
Published: (2025)

Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications /
by: Rein, S. (Stefan)
Published: (2005)