APA (7th ed.) Citation

Pacchioni, G., Skuja, L., & Griscom, D. L. (2001). Defects in SiO2 and Related Dielectrics: Science and Technology (1.). Springer Netherlands.

Chicago Style (17th ed.) Citation

Pacchioni, G., L. Skuja, and D. L. Griscom. Defects in SiO2 and Related Dielectrics: Science and Technology. 1. Dordrecht: Springer Netherlands, 2001.

MLA (9th ed.) Citation

Pacchioni, G., et al. Defects in SiO2 and Related Dielectrics: Science and Technology. 1. Springer Netherlands, 2001.