rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Scanning electron microscopy
    sub title: physics of image formation and microanalysis
  name:
    name part: Reimer, Ludwig
    name part: 1928-
    role:
      role term: creator
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: gw
    date issued: 1998
    edition: Second completely revised and updated edition.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xiv, 527 pages) : illustrations.
  abstract: Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
  table of contents: 1. Introduction -- 2. Electron optics of a scanning electron microscope -- 3. Electron scattering and diffusion -- 4. Emission of backscattered and secondary electrons -- 5. Electron detectors and spectrometers -- 6. Image contrast and signal processing -- 7. Electron-beam-induced current and cathodoluminescence -- 8. Special techniques in SEM -- 9. Crystal structure analysis by diffraction -- 10. Elemental analysis and imaging with X-rays.
  note: Ludwig Reimer.
  note: Includes bibliographical references and index.
  subject:
    topic: Scanning electron microscopy
  subject:
    topic: Elektronenmicroscopie
  subject:
    topic: Verstrooiing
  subject:
    topic: Kristalstructuur
  subject:
    topic: Rasterelektronenmikroskopie
  subject:
    topic: Scanning electron microscopy
  subject:
    topic: Optique électronique
  subject:
    topic: Instruments d'optique
  classification: QH212.S3 R452 1998eb
  classification: 502/.8/25
  classification: 33.68
  classification: PHY 135f
  classification: UH 5100
  classification: UH 6310
  related item:
    title info:
      title: Scanning electron microscopy
    name:
      name part: Reimer, Ludwig, 1928-
    origin info:
      edition: Second completely revised and updated edition
    identifier: (DLC) 98026178
    identifier: (OCoLC)39281893
  related item:
    title info:
      title: Springer series in optical sciences ; v. 45
  identifier: 9783540389675 (electronic bk.)
  identifier: 3540389679 (electronic bk.)
  identifier: 3540639764
  identifier: 9783540639763
  identifier: 9783642083723 (print)
  identifier: 3642083722 (print)
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: GW5XE
    record creation date: 140711
    record change date: 20260422173318.8
    record identifier: in00003552081
    language of cataloging:
      language term: eng