rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Evaluation of Advanced Semiconductor Materials by Electron Microscopy
  name:
    name part: Cherns, David.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  genre: Electronic books.
  origin info:
    place:
      place term: mau
    date issued: 1990
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (412 pages)
  note: edited by David Cherns.
  note: Electronic resource.
  subject:
    topic: Medicine
  subject:
    topic: Medicine
  classification: QC611.6.S9
  classification: 610
  related item:
    title info:
      title: NATO ASI series. 203
      part number: Series B
      part name: Physics
  identifier: 9781461305279
  identifier: 1461305276
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: I9W
    record creation date: 121227
    record change date: 20260420210459.7
    record identifier: in00003550374
    language of cataloging:
      language term: eng