SpringerLink (Online service) & Cherns, D. (1990). Evaluation of Advanced Semiconductor Materials by Electron Microscopy. Springer US.
Chicago Style (17th ed.) CitationSpringerLink (Online service) and David Cherns. Evaluation of Advanced Semiconductor Materials by Electron Microscopy. Boston, MA: Springer US, 1990.
MLA (9th ed.) CitationSpringerLink (Online service) and David Cherns. Evaluation of Advanced Semiconductor Materials by Electron Microscopy. Springer US, 1990.
Warning: These citations may not always be 100% accurate.