Thomas, J. P., & Cachard, A. (1978). Material Characterization Using Ion Beams. Springer US : Imprint : Springer.
Chicago Style (17th ed.) CitationThomas, J. P., and A. Cachard. Material Characterization Using Ion Beams. Boston, MA: Springer US : Imprint : Springer, 1978.
MLA (9th ed.) CitationThomas, J. P., and A. Cachard. Material Characterization Using Ion Beams. Springer US : Imprint : Springer, 1978.
Warning: These citations may not always be 100% accurate.