Cover Image

Point and extended defects in semiconductors /

Show other versions (1)
Bibliographic Details
Corporate Authors: Workshop on Point, Extended, and Surface Defects in Semiconductors Erice, Italy, SpringerLink (Online service), North Atlantic Treaty Organization. Scientific Affairs Division (sponsoring body.), International School of Materials Science and Technology
Other Authors: Benedek, G. (Giorgio) (Editor), Cavallini, A. (Anna) (Editor), Schröter, W. (Wolfgang) (Editor)
Format: Conference Proceeding eBook
Language:English
Published: New York : Plenum Press, [1989]
Series:NATO ASI series. Physics ; v. 202.
Subjects:
Semiconductors > Defects > Congresses.
Semiconducteurs > Défauts > Congrès.
Semiconductors > Defects.
Electronic books.
Conference proceedings.
Online Access:Connect to the full text of this electronic book
Description
Item Description:"Proceedings of the NATO advanced research workshop/International School of Materials Science and Technology, Second Workshop on Point, Extended, and Surface Defects in Semiconductors, held November 2-7, 1988 in Erice, Italy"--Title page verso.
"Published in cooperation with NATO Scientific Affairs Division."
Physical Description:1 online resource (x, 287 pages) : illustrations.
Bibliography:Includes bibliographical references.
ISBN:9781468457094
1468457098