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Impact of Electron and Scanning Probe Microscopy on Materials Research /

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This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also...

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Bibliographic Details
Main Author: Rickerby, David G.
Corporate Author: SpringerLink (Online service)
Other Authors: Valdrè, Giovanni, Valdrè, U. (Ugo)
Format: eBook
Language:English
Published: Dordrecht : Springer Netherlands, 1999.
Series:NATO science series. Applied sciences ; 364.
Subjects:
Chemistry, Inorganic.
Physical organic chemistry.
Surfaces (Physics)
Electronic books.
Online Access:Connect to the full text of this electronic book

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