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X-Ray Spectrometry in Electron Beam Instruments /

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This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis.

Bibliographic Details
Main Author: Williams, David B.
Corporate Author: SpringerLink (Online service)
Other Authors: Goldstein, Joseph I., Newbury, Dale E.
Format: eBook
Language:English
Published: Boston, MA : Springer US : Imprint : Springer, 1995.
Subjects:
Electron beams > Instruments.
X-ray spectroscopy.
Electron probe microanalysis.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Summary:This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis.
Item Description:Electronic resource.
Physical Description:1 online resource (390 pages)
ISBN:9781461518259 (electronic bk.)
1461518253 (electronic bk.)