Transmission electron microscopy : physics of image formation and microanalysis /

"Transmission Electron Microscopy" presents the theory of image and contrastformation, and the analytical modes in transmission electron microscopy. Theprinciples of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory...

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Bibliographic Details
Main Author: Reimer, Ludwig, 1928- (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin ; New York : Springer-Verlag, [1993]
Edition:Third edition.
Series:Springer series in optical sciences ; v. 36.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:"Transmission Electron Microscopy" presents the theory of image and contrastformation, and the analytical modes in transmission electron microscopy. Theprinciples of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also analysed are the kinetical and dynamical theories of electron diffraction and their applications for crystal-structure determination and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. The third edition includes a brief discussionof Schottky emission guns, some clarification of minor details, and references to the recent literature.
Physical Description:1 online resource (xiii, 545 pages) : illustrations.
Bibliography:Includes bibliographical references (pages 465-533) and index.
ISBN:9783662215562 (electronic bk.)
366221556X (electronic bk.)