Critical technology events (CTEs) that support the rationale for Army laboratories based on S&T functions performed /

Bibliographic Details
Main Authors: Ratches, James A. (Author), Lyons, John W., 1930- (Author)
Format: Government Document eBook
Language:English
Published: [Washington, D.C.] : Center for Technology and National Security Policy, National Defense University, 2013.
Series:Defense & technology papers ; no. 103.
Subjects:
Online Access:https://purl.fdlp.gov/GPO/gpo55603
http://purl.fdlp.gov/GPO/gpo55603
Description
Item Description:Title from title screen (viewed November 12, 2013).
"September 2013."
Physical Description:1 online resource (44 pages).
Bibliography:Includes bibliographical references.