Performance and reliability of bonded interfaces for high-temperature packaging /

Power electronics materials and bonded interfaces - reliability and lifetime /
by: Paret, Paul
Published: (2021)

Power electronics materials and bonded interfaces - reliability and lifetime /
by: Paret, Paul
Published: (2020)

Bonded interfaces for high-temperature power electronics /
by: Paret, Paul
Published: (2021)

Investigation of thermal interface materials using phase-sensitive transient thermoreflectance technique : preprint /
by: Feng, Xuhui
Published: (2014)

Advanced power electronics designs - reliability and prognostics : (Keystone Project 1) /
by: DeVoto, Douglas
Published: (2021)

Design and characterization of nanowire array as thermal interface material for electronics packaging /
by: Chiang, Juei-Chun
Published: (2010)

Stability of CIGS solar cells and component materials evaluated by a step-stress accelerated degradation test method : preprint /
by: Pern, F. J. (Fu-Jann), 1952-
Published: (2012)

Using accelerated testing to predict module reliability : preprint /
by: Wohlgemuth, J. (John), 1946-
Published: (2011)

Evaluation of permanent magnets for high temperature operations /
by: Van Hees, Elizabeth, 1959-
Published: (1985)

Reliability prediction and testing textbook /
by: Klyatis, Lev M., et al.
Published: (2018)

Accelerated quality and reliability solutions /
by: Klyatis, Lev M.
Published: (2006)

Design and analysis of accelerated tests for mission critical reliability /
by: LuValle, Michael J., et al.
Published: (2004)

Synthesis of thermal interface materials made of metal decorated carbon nanotubes and polymers /
by: Okoth, Marion Odul
Published: (2011)

Accelerated quality and reliability solutions /
by: Klyatis, Lev M.
Published: (2006)

Durability testing of nonmetallic materials /
Published: (1996)

Life prediction methodologies and data for ceramic materials /
Published: (1994)

Design and analysis of accelerated tests for mission critical reliability /
by: LuValle, Michael J.
Published: (2004)

Accelerated reliability engineering : HALT and HASS /
by: Hobbs, Gregg K., 1939-
Published: (2000)

Symposium of Northeastern accelerator personnel : Holifield Heavy Ion Research Facility, Oak Ridge National Laboratory, October 23-26, 1989 /
Published: (1990)

Symposium of North Eastern Accelerator Personnel, James R. Macdonald Laboratory, Kansas State University, October 22-25, 1990 /
Published: (1991)

Symposium of North Eastern Accelerator Personnel : Western Michigan University, Kalamazoo, Michigan, October 12-15, 1994 /
Published: (1995)

Stanford Accelerator Power Supply : hearings before the United States Joint Committee on Atomic Energy, Eighty-Eighth Congress, second session, on Jan. 29, 1964.
Published: (1964)

Ultra high temperature mechanical testing /
Published: (1995)

International PV QA Task Force (PVQAT) /
by: Kurtz, S. R.
Published: (2014)

New generation HMA mix designs : accelerated pavement testing of a type C mix with the ALF machine /
by: Walubita, Lubinda F., et al.
Published: (2013)

New generation HMA mix designs : accelerated pavement testing of a type C mix with the ALF machine /
by: Walubita, Lubinda F., et al.
Published: (2013)

New generation mix designs : laboratory testing and construction of the APT test sections /
Published: (2010)

New generation mix-designs : laboratory-field testing and modifications to Texas HMA mix-design procedures /
by: Walubita, Lubinda F., et al.
Published: (2013)

Characterization of multicrystalline silicon modules with system bias voltage applied in damp heat /
Published: (2011)

Influence of temperature on microelectronics and system reliability /
by: Lall, Pradeep
Published: (1997)

Symposium of North Eastern Accelerator Personnel, Sante Fe, New Mexico, Los Alamos National Laboratory, October 16-19, 1991 /
Published: (1992)

Brain computer interfaces.
Published: (2014)

Analysis of step-stress models : existing results and some recent developments /
by: Kundu, Debasis
Published: (2017)

High temperature electronics /
Published: (1999)

The effect of temperature and other factors on plastics and elastomers /
by: McKeen, Laurence W.
Published: (2008)

CMOS temperature sensor utilizing interface-trap charge pumping /
by: Berber, Feyza, 1978-
Published: (2006)