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CTL for test information of digital ICs /

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Bibliographic Details
Main Author: Kapur, Rohit
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Boston : Kluwer Academic Publishers, 2003.
Subjects:
Digital integrated circuits > Testing > Standards.
Computer hardware description languages.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Electronic books.
Online Access:Connect to the full text of this electronic book
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by Kapur, Rohit
Published 2003
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Book
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