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CTL for test information of digital ICs /

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Bibliographic Details
Main Author: Kapur, Rohit
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Boston : Kluwer Academic Publishers, 2003.
Subjects:
Digital integrated circuits > Testing > Standards.
Computer hardware description languages.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:1 online resource (ix, 173 pages) : illustrations
ISBN:0306478269 (electronic bk.)
9780306478260 (electronic bk.)
9781402072932 (print)
1402072937 (print)