Ion beam surface layer analysis /

Bibliographic Details
Corporate Authors:	International Conference on Ion Beam Surface Layer Analysis Karlsruhe, Germany, SpringerLink (Online service)
Other Authors:	Meyer, O. (Otto), Linker, Gerhard, Käppeler, F. (Franz)
Format:	Conference Proceeding eBook
Language:	English
Published:	New York : Plenum Press, [1976]
Subjects:	Thin films > Effect of radiation on > Congresses. Ion bombardment > Congresses. Straggling (Nuclear physics) > Congresses. Backscattering > Congresses. Surfaces (Technology) > Congresses. Backscattering. Ion bombardment. Straggling (Nuclear physics) Surfaces (Technology) Thin films > Effect of radiation on. Electronic books. Conference proceedings.
Online Access:	Connect to the full text of this electronic book

Published 1976

Conference Proceeding Book