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Nanoscale spectroscopy and its applications to semiconductor research /

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Fabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical pro- perties of such nanostructures are a subject of advanced re- search. This book describes the different approaches to spectroscopic microscopy, i.e., electron beam probe spec- trosc...

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Bibliographic Details
Corporate Authors: International Workshop on Nanoscale Spectroscopy and its Applications to Semiconductor Research Trieste, Italy, SpringerLink (Online service)
Other Authors: Watanabe, Yoshio, 1954-
Format: Conference Proceeding eBook
Language:English
Published: Berlin ; Heidelberg : Springer, 2002.
Series:Lecture notes in physics ; 588.
Subjects:
Electron spectroscopy > Congresses.
Electron microscopy > Congresses.
Semiconductors > Materials > Congresses.
Nanostructured materials > Congresses.
Electron microscopy.
Electron spectroscopy.
Nanostructured materials.
Semiconductors > Materials.
Electronic books.
Conference proceedings.
Online Access:Connect to the full text of this electronic book
Description
Summary:Fabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical pro- perties of such nanostructures are a subject of advanced re- search. This book describes the different approaches to spectroscopic microscopy, i.e., electron beam probe spec- troscopy, spectroscopic photoelectron microscopy, and scan- ning probe spectroscopy. It will be useful as a compact source of reference for the experienced researcher, taking into account at the same time the needs of postgraduate stu- dents and nonspecialist researchers by using a tutorial ap- proach throughout. Fabrication technologies for nano-structured devices have been developed recently, and the electrical and optical properties of such nonostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, that is, Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking at the same time into account the needs of post graduate students and nonspecialist researchers by using a tutorial approach throughout.
Item Description:Electronic resource.
Physical Description:1 online resource (xv, 306 pages) : illustrations.
Bibliography:Includes bibliographical references and index.
ISBN:9783540458500
3540458506
ISSN:0075-8450 ;