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Examining the submicron world /

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Bibliographic Details
Corporate Authors: NATO Advanced Study Institute on Improved Methods for Examining the Submicron World Nova Scotia, SpringerLink (Online service)
Other Authors: Feder, Ralph, McGowan, J. William (James William), 1931-, Shinozaki, Douglas M.
Format: Conference Proceeding eBook
Language:English
Published: New York : Plenum Press, [1986]
Series:NATO ASI series. Physics ; v. 137.
Subjects:
Electron microscopy > Congresses.
X-ray microscopy > Congresses.
Ultrastructure (Biology) > Congresses.
Electron microscopy.
Ultrastructure (Biology)
X-ray microscopy.
Electron microscopy
Electronic books.
Conference proceedings.
Online Access:Connect to the full text of this electronic book
Description
Item Description:"Proceedings of a NATO Advanced Study Institute on Improved Methods for Examining the Submicron World, held July 28-August 11, 1984, in Nova Scotia"--Title page verso.
Electronic resource.
Physical Description:1 online resource (xii, 372 pages) : illustrations.
Format:Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Bibliography:Includes bibliographical references and index.
ISBN:9781461322092 (electronic bk.)
146132209X (electronic bk.)