Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 /

Bibliographic Details
Corporate Authors:	International Conference on Secondary Ion Mass Spectrometry Stanford University, SpringerLink (Online service)
Other Authors:	Benninghoven, A.
Format:	Conference Proceeding eBook
Language:	English
Published:	New York : Springer-Verlag, 1979.
Series:	Springer series in chemical physics ; 9.
Subjects:	Secondary ion mass spectrometry > Congresses. Secondary ion mass spectrometry. Electronic books. Conference proceedings.
Online Access:	Connect to the full text of this electronic book

Published 1979

Conference Proceeding Book