http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Secondary ion mass spectrometry, SIMS-II
proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979
International Conference on Secondary Ion Mass Spectrometry 1979 : Stanford University)
1 online resource (xiii, 298 pages) : illustrations.
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL
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Includes bibliographical references and index.
International Conference on Secondary Ion Mass Spectrometry (2nd : 1979 : Stanford University).