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Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 /

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Bibliographic Details
Corporate Authors: International Conference on Secondary Ion Mass Spectrometry Stanford University, SpringerLink (Online service)
Other Authors: Benninghoven, A.
Format: Conference Proceeding eBook
Language:English
Published: New York : Springer-Verlag, 1979.
Series:Springer series in chemical physics ; 9.
Subjects:
Secondary ion mass spectrometry > Congresses.
Secondary ion mass spectrometry.
Electronic books.
Conference proceedings.
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:1 online resource (xiii, 298 pages) : illustrations.
Format:Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Bibliography:Includes bibliographical references and index.
ISBN:9783642618710 (electronic bk.)
3642618715 (electronic bk.)